STC P - Precision Engineering and Metrology
Chairman: Prof. Andreas Archenti
Vice-Chairman: Prof. Yasuhiro Takaya
Secretary: Prof. Edward Morse
STC P deals with research, design, and development of methods, instruments, sensors, transducers and complete metrology systems and application of them to manufactured products and equipment for the efficient control of quality in production processes and manufacturing systems including:
- the metrology of comprehensive geometrical quantities such as length, angle, displacement, profile and surface topography including surface integrity applied as closely as possible to the point of manufacture,
- design and uncertainty budgeting for optimized control strategies in measurement instruments and precision manufacturing equipment, including precision machine tools and components, etc.,
- sensors for physical and mechanical quantities such as position, velocity, acceleration, force, temperature, pressure etc. for process quality monitoring and control,
- nano-metrology for application to nanotechnology and nanomanufacturing processes and machines,
- responsibility for surveying emerging manufacturing technologies, processes and equipment for identifying trends, and relevant research and development needs in precision engineering and metrology (e.g., nanotechnology applications, additive manufacturing),
- metrological calibration of machines, sub-systems and instruments for traceability as well as for performance improvement through various geometrical and thermal error compensation strategies,
- terminology, symbols and standards for precision engineering and metrology.
CIRP Members: to see the Agendas and Minutes, you must log in.